SIMS artifacts in the near surface depths profiling of oxygen conducting ceramics
||Fearn, S, Rossiny, J. and Kilner, J.A. SIMS artifacts in the near surface depths profiling of oxygen conducting ceramics. 2008. https://doi.org/10.1016/j.ssi.2008.01.020. Cite this using DataCite|
||Fearn, S, Rossiny, J. and Kilner, J.A.|
||Solid State Ionics|
Using ultra low energy SIMS ion beams of oxygen and nitrogen, the very near surface region of an16O annealed La0.8Sr0.2MnO3pellet has been depth profiled in order to investigate the surface layer composition and to determine any perturbing ion beamtarget interactions. By ratioing the measured cation species, the results indicate that only Sr segregation at the near surface can be clearly identified, and no separate oxide layer was present on the top surface. By monitoring the build up of the altered layer associated with SIMS depth profiling, it was observed that the depth at which the altered layer was fully formed was deeper than the expected projected range,Rp, of the ion beam. These results confirm Sr excess in the near surface, which will have an effect on the vacancy concentrationand therefore thesurface exchange coefficient,k.