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X-RAY DIFFRACTION CAPABILITY FOR NANOSCALE AND THIN FILM STRUCTURE

Reference Number
EP/P001513/1
Title
X-RAY DIFFRACTION CAPABILITY FOR NANOSCALE AND THIN FILM STRUCTURE
Status
Completed
Energy Categories
Energy Efficiency(Other)
Renewable Energy Sources(Solar Energy, Photovoltaics)
Not Energy Related
Other Power and Storage Technologies(Electric power conversion)
Other Power and Storage Technologies(Energy storage)
Research Types
Equipment
Science and Technology Fields
PHYSICAL SCIENCES AND MATHEMATICS (Physics)
PHYSICAL SCIENCES AND MATHEMATICS (Metallurgy and Materials)
UKERC Cross Cutting Characterisation
Not Cross-cutting
Principal Investigator
Dr J Alaria
Physics
University of Liverpool
Award Type
Standard
Funding Source
EPSRC
Start Date
01 June 2016
End Date
31 May 2017
Duration
12 months
Total Grant Value
£360,000
Industrial Sectors
Materials sciences
Region
North West
Programme
NC : Infrastructure
Investigators
Principal Investigator
Dr J Alaria, Physics, University of Liverpool
Other Investigator
Professor K Badcock, Mech, Materials & Aerospace Engineerin, University of Liverpool
Dr JB Claridge, Chemistry, University of Liverpool
Professor CA Lucas, Physics, University of Liverpool
Web Site
Objectives
Abstract
The specific arrangements of matter at the atomic scale gives advance functional materials their unique properties. Therefore, the future in materials design relies on our ability to control nanoscale structures. To achieve this, a vital tool for material scientist is x-ray diffraction as it allows in-depth characterisation of the crystal structure.Here we propose to establish an x-ray diffractometer dedicated to nanoscale and thin film structure with a set of capabilities which will enable material scientist to study the structural properties of polycrystalline and epitaxial films and probe the interface quality and structure which often dictates the performance and functionality of the nanoscale material. The high throughput capability offered by this equipment will play a vital role in atomic scale design of functional materials and process optimisation for integration in device. It will enable the routine measurement of phase purity, crystalline quality, thickness and roughness using non-destructive method. More advanced measurements will be used to determine epitaxial relationship and texture of the nanostructures. The materials studied have applications in renewable energy (photovoltaic, battery, thermoelectric), electronic (transparent conducting oxides, dielectrics, semiconductor alloys)
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Added to Database
28/03/19