Projects
Projects: Projects for Investigator |
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| Reference Number | GR/T03307/01 | |
| Title | Optimised Efficiency of Thin Film Photovoltaic Device | |
| Status | Completed | |
| Energy Categories | Renewable Energy Sources(Solar Energy, Photovoltaics) 100%; | |
| Research Types | Basic and strategic applied research 100% | |
| Science and Technology Fields | ENGINEERING AND TECHNOLOGY (Electrical and Electronic Engineering) 100% | |
| UKERC Cross Cutting Characterisation | Not Cross-cutting 100% | |
| Principal Investigator |
Dr R Gottschalg No email address given Electronic and Electrical Engineering Loughborough University |
|
| Award Type | Standard | |
| Funding Source | EPSRC | |
| Start Date | 01 October 2004 | |
| End Date | 30 September 2009 | |
| Duration | 60 months | |
| Total Grant Value | £263,886 | |
| Industrial Sectors | Energy | |
| Region | East Midlands | |
| Programme | Materials, Mechanical and Medical Eng | |
| Investigators | Principal Investigator | Dr R Gottschalg , Electronic and Electrical Engineering, Loughborough University (100.000%) |
| Web Site | ||
| Objectives | ||
| Abstract | The ARF will develop a three imensional model based on distributed diode characteristics for all currently commercialised thin film device structures. The initial focus will be on micromorph and CdTe devices without a metallic back contact. A novel measurementapparatus will be built specifically to measure of these distributed diode characteristics. The model be used to investigate the well known difference of laboratory efficiency and realistic outdoor operating efficiency. A separation of the environmental effects will be possible and an optimisation of device structurescan be carried out for energy yield. This will address the most pressing issue of thin film photovoltaics: the high cost of electricity generation. Collaborating with internationally leading research institutes will ensure scientific relevance. The existing LBIC system will be extended to allow the investigation of integrally interconnected multi-junction devices. Critically, it will be able to measure each junction in a multi-junction separately. The measurement science will be developed that localised I-V measurements can be taken. Close relationship with manufacturers will allow to develop new algorithms for the identification of production problems and ensure a speedy dissemination | |
| Publications | (none) |
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| Final Report | (none) |
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| Added to Database | 01/01/07 | |
